Scanning Electron Microscope
- Digital imaging of specimens, from low 10X up to 200,000X magnification.
- Secondary-electron (SE) imaging provides excellent imaging of surface topography.
- Back-scattered electron (BSE) imaging is also offered, which provides the user a unique way to view elemental changes on specimen surfaces.
Elemental microanalysis via energy-dispersive x-ray spectroscopy (EDS) provides the user with an elemental spectrum of an area of interest.