Scanning Electron Microscope

SEM Imaging

  • Digital imaging of specimens, from low 10X up to 200,000X magnification.
  • Secondary-electron (SE) imaging provides excellent imaging of surface topography.
  • Back-scattered electron (BSE) imaging is also offered, which provides the user a unique way to view elemental changes on specimen surfaces. 


Elemental microanalysis via energy-dispersive x-ray spectroscopy (EDS) provides the user with an elemental spectrum of an area of interest. 


 Dan Schmidt has operated a JEOL 840 scanning electron microscope for over 20 years and has achieved over 10,000 hours of analysis time on this analytical instrument.

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